X-ray fluorescence energy dispersive general purpose spectrometer BRA-135F
Energy Dispersive X-Ray Fluorescence Spectrometer BRA-135F is able to detect simultaneously about 20 chemical elements less than 200 sec over a wide concentration range from hundreds of ppb. BRA-135F is able to analyze solid, liquid and powder samples, as well as materials on the surface or deposits on the filters.
The vacuum measurement chamber and ultrathin input window of detector provides high analytical characteristics in range of light elements from 9 F to 17 Cl.
High-performance silicon drift detector (SDD) with low energy resolution (less 135eV) is able to define spectral lines almost all elements, that allows the analysis of complex multicomponent substances (high alloy steels, precision alloys, polymetallic ores, etc.).
Technical data
Range of determined elements
from 9 F to 92 U
Range of determination without preconcentration, %
- for elements from Na to Mg
- for elements from Al to Cl
- for elements from K to U
10-2
0.002
0.0005
Range of determination with sample preconcentration depending on chemical element, %
1.5*10-5
Limit of the middle group elements detection in liquids, %
n*10-5
Average time for 1 (one) sample analysis, sec
100
Energy resolution of MnKα line at the pulses counting rate up to 104 sec-1 , max, eV
145
Maximum voltage of the X-ray tube, kV
50
Power of the X-ray tube, W
10
Cooling of the X-ray tube
air
Primary X-ray radiation filters
5
Number of samples installed into sample changer, up to
changer #1 (Ø34 mm samples)
changer #2 (Ø34,36,40,44 mm samples)
15
11
Maximum size of substandard specimen, mm
200х60
Connection to Ethernet
Yes
Remote control
Yes
Overall dimensions of the instrument (L х W х H), mm
700х410х400
Weight of the instrument, kg
65
Power supply
220 V, 50 Hz
Power consumption, VA
500
Process diagram Principle of Operation
Principle of spectrometer operation is based on the excitation of fluorescent radiation of atoms of material under examination by radiation coming from an X-ray tube. The fluorescence radiation from the specimen is selected by the semiconductor SDD detector where after being absorbed quanta of various energy are converted into electrical pulses with amplitudes being proportional to energy of these quanta. Pulse repetition frequency with a certain amplitude is proportional to chemical element concentration in the sample.