General-Purpose X-ray diffractometer DRON-8

General purpose X-ray diffractometer DRON-8 with vertical theta - theta goniometer and sample horizontal position enables to perform X-ray diffraction analysis of phase composition, structural state and orientation of heavy large-size and irregular-form samples.

Instrument DRON-8 has high technical and operational characteristics as compared with DRON-7 model being issued these days. Goniometer has a changeable radius (180-250 mm), angle position reproducibility is not more than 0.001 deg., automatic adjustment of the sample plane is provided; there are 6 algorithms for independent and synchronous moving of X-ray tube and detector that covers all known methods of XRD analysis. There is a number of options that are possible for DRON-7. Four-axles holder for large samples (xy-scanning, z-moving, φ-rotation) is added to allow to analyse large objects of different shapes (plates, single crystals and other odd-shaped samples) both for the analysis of their phase composition and structural state, and for control of their surface orientation in relation to the crystallographic axes.

Production of diffractometers DRON-8 started in 2010.

Technical data
Drawings
Process diagram
Scope of application
Options
Application Notes
Software
Reviews
Video
Advertising materials

Technical data

Goniometer

Type		Vertical θ- θ
X-ray optics		Bragg-Brentano/Debye-Scherrer/parallel-beam
Raduis R, mm		180-250
Angular range, deg.	2θ	from -10 to 165 (up to 169 at R=200 mm)
	θ_D	from -5 to 165
	θ_F	from -5 to 95
Scanning modes		stepped/continuous
Scanning technique:		θ-θ, θ, Ω, 2θ-Ω, Ѱ, sin²Ѱ
Min. scanning step, deg.		0.0005
Scanning rate, deg./min		from 0.1 to 50
Reproducibility, deg.		±0.001
Travelling speed, deg/min		600

Recording system (base):

Detector type		Scintillation NaI (Tl)
Counting rate, imp/sec		up to 500,000

High-voltage power source:

Power supply, kW		3
Voltage, KV		0-60
Current, mA		0-80
Anode current and voltage stability, %		0.01
Cooling		air cooling

X-Ray Tube (base):

Type		2,5BSV-27Cu
Focus, mm		10 х 1.6
Cooling		water cooling (3 l/min)

Performance

Installation area, m²		5
Power consumption, kVA		5.5
Weight, kg		750
Power, V/Hz		Single-phase 220/50
Overall dimensions (L х W х H), mm		1350 х 1200 х 2250

Scope of application

Options

Sample stages, Attachments and chambers
	Four-axis xyzφ stage for large samples to study bulk objects (up to 300 mm diam., up to 250 mm height and up to 50 kg weight) including oddly shaped samples with uneven surfaces, as well as for mapping of phase composition and structural characteristics across sample surface.
	Two-axis χ,φ attachment for analysis of textures and residual stresses in polycrystalline samples and for the determination of crystal orientation up to 28 mm in diameter.
	High-temperature chambers (up to 1200, 1600, 2000 and 2300°С) for in situ tracing of phase transformation and chemical reactions in changeable environment.
	The vacuum system
	Autosampler for 6 positions.
Registration systems
	X-ray registration system based on linear position-sensitive stripped detector.
	X-ray registration system based on solid-state energy-dispersive Peltier-cooled detector.
X-ray optical elements
	Versatile primary beam monochromator.
	Versatile diffracted beam monochromator.
	Different types of crystals-monochromators (plane, asymmetric, curved, channel-cut) from different materials.
	One-dimensional parabolic mirror for parallel-beam geometry.
	а 4-bounce channel-cut monochromator (4 x Ge 220) on a primary beam singles out a monochromatic Kα1 line with anglular resolution of about 6” for high resolution geometry.
	Channel-cut monochromator with variable (from 1 to 5) multiplicity on the primary beam singles out monochromatic Kα or Kα1 line . It is used for SAXS measurements and reflectometry.
Other options
	Closed cooling system (chiller).
	BSV- 27...29 and BSV-40...42 X-ray tubes with different of focus sizes and different anode materials.
	Soller slits with divergence of 1.5 to 4 degrees for collimation of diffracted beam when point or position-sensitive detectors are used.
	β-filters for monochromatization of various X-ray radiations when point or position-sensitive detectors are used.

Process diagram

Reviews

REPORT on X-ray Diffractometer DRON-8 Produced by Investigation Development Manufacture "Bourevestnik". (Translated from Russian)

Advertising materials

Drawings

Video

Application Notes

X-ray diff raction monitoring of product quality in cement industry.

Application of XRD phase analysis and Rietveld refinement to the technological diagnostics and dating of paintings.

Software

	Data processing - DrWin • Processing of diffraction pattern or selection • Background approximation (by polynomial or user curve) • Separation of K-doublets• Peak seach and determination of their anglular positions • Approximation of reflection profiles by pseudo-Voigt function (for the entire array or independently for each peak) • Calculation of peak heights and their integral intensities • Calculation of FWHM of reflections
	Quantitative phase analysis - Quan • Overall analysis of multicomponent mixture • Analysis of n-component system • Analysis of sample with known mass absorption coefficient • Method of internal standard • Method of Reference Intensity Ratios (RIR’s) • Method of additives • Method of reduction
	Calculation of average size of coherent domains and of microstrains - Size&Strain • Calculation of size of coherent domains and microstrains by the method of second central moments • Calculation of instrumental line broadening • Application of absorption correction to the samples with another composition
	Calculation of theoretical diffraction pattern - TheorPattern • Simulation of diffraction patterns of multicomponent mixtures from structural data • Account for of instrumental factor • Account for texture and crystalline size for each component • Comparison of simulated and measured diffraction patterns • Integrated package of geometrical crystallography
	Auto indexing of Powder Diffraction Pattern - Ind • Determination of Bravais lattice type • Choice of unit cell • Computation of Miller indices for selected lines • Bar graph of input diffraction pattern
	Full profile analysis by Rietveld method - Rietveld • Refinement of crystal structures from X-ray powder diffraction data of single crystalline phases and mixtures • Calculation of polynominal and physical background • Independent refinement of U, V, W, X, Y profile for different phases and for different groups of reflections • Refinement of unit cell parameters, atomic and thermal parameters, occupations of atomic positions for each phase • Choice of refinement strategy • Control of Rrefinement conditions • Calculation of five R-factors
	Residual stress analysis - MacroStress • Calculation of peak angular position from center of gravity or from peak topapex • Correcting of correction matrix • Calculation of linear, planar and volumetric stresses • Calculation of stress deviations
	High temperature-X-ray diffraction - Thermo • 3D-imaging of measured data in “diffraction angle - intensity - temperature” co-ordinates • Calibration of the measured data set by internal or external standard • Refinement of unit cell parameters of the calibrated data set • Determination of phase transition points • Determination of thermal expansion coefficients (TEC) in different directions and thermal deformation tensors • Building of TEC figures
	Qualitative phase analysis and access to the Ppowder Diffraction File database - Retrieve and Search-Match • Use of PDF-2/PDF-4 database of International Center of Diffraction< Data (ICDD) for qualitative analysis • Automatic or manual search algorithm Creation of user subbases for search facilitation • Addition of user standards into subbases • Qualitative phase analysis by different criteria, bases (subbases) Analysis of lines matched by angular position and intensity • Quantitative phase analysis by Reference Intensity Ratios (RIR’s) method • Access to the data base including search by selected criteria