General-Purpose X-ray diffractometer DRON-7M
Technical data
Goniometer
Type |
Horizontal 2θ-θ
|
X-ray optics |
Bragg-Brentano/Debye-Scherrer/parallel-beam
|
Raduis R, mm |
200
|
Angular range, deg. | 2θ |
from -100 to 165
|
| θ |
from -180 to 180
|
Scanning mode |
stepped/continuous
|
Scanning technique: |
θ-2θ, 2θ , θ, 2θ-Ω
|
Min. scanning step, deg. |
0.001
|
Scanning rate, deg./min |
from 0.1 to 50
|
Reproducibility, deg. |
±0.0025
|
Travelling speed, deg/min |
720
|
Recording system (base):
Detector type |
Scintillation
NaI (Tl)
|
Counting rate, imp/sec |
up to 500,000
|
High-voltage power source:
Power supply, kW |
3
|
Voltage, KV |
0-60
|
Current, mA |
0-80
|
Anode current and voltage stability, % |
0.01
|
Cooling |
air cooling
|
X-Ray Tube (base):
Type |
2,5BSV-27Cu
|
Focus, mm |
10 х 1.6
|
Cooling |
water cooling (3 l/min)
|
Performance
Installation area, m2 |
5
|
Power consumption, kVA |
5.5
|
Weight, kg |
520
|
Power, V/Hz |
Single-phase 220/50
|
Overall dimensions (L х W х H), mm |
1050 х 1100 х 1800
|
Options
Sample stages, Attachments and chambers |
 | Stage for bulk samples to install samples with thickness of up to 10 mm and length of up to 100 mm. |
 | Stage for cylindrical samples (capillaries) of 0.1-1.0 mm in diameter to for measure patterns in Debye-Sherrer geometry. |
 | Two-axis χ,φ attachment for analysis of textures and residual stresses in polycrystalline samples and for the determination of crystal orientation up to 28 mm in diameter. |
 | High-temperature chambers (up to 1200°С) for in situ tracing of phase transformation and chemical reactions in changeable environment. |
 | The vacuum system |
 | Autosampler for 6 positions. |
Registration systems |
 | X-ray registration system based on linear position-sensitive stripped detector. |
 | X-ray registration system based on solid-state energy-dispersive Peltier-cooled detector. |
X-ray optical elements |
 | Versatile primary beam monochromator. |
 | Versatile diffracted beam monochromator. |
 | Different types of crystals-monochromators (plane, asymmetric, curved, channel-cut) from different materials. |
 | One-dimensional parabolic mirror for parallel-beam geometry. |
Other options |
 | Closed cooling system (chiller). |
 | BSV- 27...29 and BSV-40...42 X-ray tubes with different of focus sizes and different anode materials. |
 | Soller slits with divergence of 1.5 to 4 degrees for collimation of diffracted beam when point or position-sensitive detectors are used. |
 | β-filters for monochromatization of various X-ray radiations when point or position-sensitive detectors are used. |
Process diagram

Video
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00:00:00
Software
 | Data processing - DrWin
• Processing of diffraction pattern or selection
• Background approximation (by polynomial or user curve)
• Separation of K-doublets• Peak seach and determination of their anglular positions
• Approximation of reflection profiles by pseudo-Voigt function (for the entire array or independently for each peak)
• Calculation of peak heights and their integral intensities
• Calculation of FWHM of reflections |
 | Quantitative phase analysis - Quan
• Overall analysis of multicomponent mixture
• Analysis of n-component system
• Analysis of sample with known mass absorption coefficient
• Method of internal standard
• Method of Reference Intensity Ratios (RIR’s)
• Method of additives
• Method of reduction |
 | Calculation of average size of coherent domains and of microstrains - Size&Strain
• Calculation of size of coherent domains and microstrains by the method of second central moments
• Calculation of instrumental line broadening
• Application of absorption correction to the samples with another composition |
  | Calculation of theoretical diffraction pattern - TheorPattern
• Simulation of diffraction patterns of multicomponent mixtures from structural data
• Account for of instrumental factor
• Account for texture and crystalline size for each component
• Comparison of simulated and measured diffraction patterns
• Integrated package of geometrical crystallography |
 | Auto indexing of Powder Diffraction Pattern - Ind
• Determination of Bravais lattice type
• Choice of unit cell
• Computation of Miller indices for selected lines
• Bar graph of input diffraction pattern |
 | Full profile analysis by Rietveld method - Rietveld
• Refinement of crystal structures from X-ray powder diffraction data of single crystalline phases and mixtures
• Calculation of polynominal and physical background
• Independent refinement of U, V, W, X, Y profile for different phases and for different groups of reflections
• Refinement of unit cell parameters, atomic and thermal parameters, occupations of atomic positions for each phase
• Choice of refinement strategy
• Control of Rrefinement conditions
• Calculation of five R-factors |
 | Residual stress analysis - MacroStress
• Calculation of peak angular position from center of gravity or from peak topapex
• Correcting of correction matrix
• Calculation of linear, planar and volumetric stresses
• Calculation of stress deviations |
  | High temperature-X-ray diffraction - Thermo
• 3D-imaging of measured data in “diffraction angle - intensity - temperature” co-ordinates
• Calibration of the measured data set by internal or external standard
• Refinement of unit cell parameters of the calibrated data set
• Determination of phase transition points
• Determination of thermal expansion coefficients (TEC) in different directions and thermal deformation tensors
• Building of TEC figures |
 | Qualitative phase analysis and access to the Ppowder Diffraction File database - Retrieve and Search-Match
• Use of PDF-2/PDF-4 database of International Center of Diffraction< Data (ICDD) for qualitative analysis
• Automatic or manual search algorithm
Creation of user subbases for search facilitation
• Addition of user standards into subbases
• Qualitative phase analysis by different criteria, bases (subbases)
Analysis of lines matched by angular position and intensity
• Quantitative phase analysis by Reference Intensity Ratios (RIR’s) method
• Access to the data base including search by selected criteria |